The Microlab product family is designed to prepare cross sections of conductor crimps and insulation crimps easily and comfortably within a few minutes. After cutting, polishing and etching of the sample, the image of the cross section can be visualized on the screen. Now a comprehensive quality check of the crimp can be performed by using the special designed image processing software X-Scan.
Equipped with a high quality 12x zoom objective the Microlab ML 3700 is the ideal tool to conduct quality tests quick and comfortable. The high resolution camera delivers first-class digital colour pictures which can be easily measured with the automatic function of the image processing software X-Scan. Automatically generated records can be used as proofs of quality. Of course, X-Scan fulfills all relevant DIN standards and OEM specifications.
Complete micrograph laboratory integrated in an MDF board
Easily operated optic with 12x zoom objective with an outstanding combination of zoom and resolution
First-class digital colour camera USB 3.0 with CMOS sensor and a resolution of 3072x2048 pixels
Well suited for cross sections from 0.1 to 10 mm² (AWG 28 – AWG 10)
Comfortable analysis software X-Scan
Optional: integrated Cut Camera (VCS) for exact cut control, easily operated by touch display
Optional: equipment packages ancillary lenses 0.25x or 0.5x for larger measuring objects
Optional: ML 3700-pc version with integrated mini PC incl. license for Windows 11 prof., monitor, mouse and keyboard)
