To evaluate the crimp quality you have to generate a cross section of the conductor crimp. With a measuring microscope and a suitable analysis software the microsection can be measured, rated and documented as per relevant norms or specified customer requirements.
The Optic Station ML 3212 is a first-class measuring microscope for examining the crimp after the polishing process. It has a 12x zoom lens with an outstanding combination of zoom range and resolution as well as an excellent color digital camera, which allows the generation of very high quality micrographs.
All our optic stations are installed on a stainless steel laminated MDF board and include the innovative and comfortable analysis software X-Scan.
Laptop or PC are not included in standard delivery and have to be requested separately.
First class zoom optic with 12:1 image enlargement
Fits for object dimensions from 1.1 x 1.6 up to 14 x 19 mm
Lowest enlargement factor 0.58x: object size 7.3 x 9.7mm
Highest enlargement factor 7x: object size 0.59 x 0.8 mm
Object size 130-11x on a 17“ monitor
Reproducible detent function
Microscope mount with coaxial fine and coarse drive for focus adjustment
LED ring light with Fresnel lens AA100 mm to illuminate the field of view
High performance digital colour camera USB 3.0 with CMOS sensor and a resolution of 3072x2048 pixels
Optional: ancillary lens 0.5x or 0.25x for larger objects
Prospekt_ML3212_EN.pdf [355 KB]